What is the correct sequence of the following step in the fabrication of a monolithic, bipolar junction transistor ? 1. Emitter diffusion Select the correct sequence using the codes given below :
2. Base diffusion
3. Buried layer formation
4. Epi-layer formation
3, 4, 2, 1
Two orderings are forced by physics, and together they fix the whole sequence.
First: the buried layer must precede the epitaxial layer. The \(n^{+}\) buried layer is diffused into the p-type substrate before the epi-layer is grown over it — that is what "buried" means. Its purpose is to provide a low-resistance path from the active collector region to the collector contact, cutting the collector series resistance and so reducing saturation voltage and improving switching speed. So 3 comes before 4, which eliminates options 2 and 4.
Second: the base must precede the emitter. The emitter is diffused into the base region, and it must be more heavily doped so that it overcompensates the base doping and forms a junction inside it. Diffusing the emitter first would leave nothing to diffuse it into. So 2 comes before 1, which eliminates option 1 and leaves option 3.
The complete flow :
| Step | Operation | Purpose |
|---|---|---|
| 1 | Buried layer (3) | n+ region in the p substrate, to lower collector resistance |
| 2 | Epitaxial growth (4) | Lightly doped n layer — becomes the collector |
| 3 | Isolation diffusion | p+ walls to separate adjacent devices |
| 4 | Base diffusion (2) | p region inside the epi-layer |
| 5 | Emitter diffusion (1) | n+ region inside the base |
| 6 | Contact windows and metallisation | Aluminium interconnect |
So the answer is 3, 4, 2, 1.
The general rule the sequence illustrates : each diffusion is more heavily doped than the region it enters, and each is shallower, so the doping profile is built from the bottom up. That is also why every subsequent high-temperature step drives the earlier diffusions deeper — the thermal budget must be planned for the whole sequence, not step by step.
Why "monolithic" matters here. In a discrete transistor the collector is the substrate itself and the collector contact is on the back. A monolithic device has all three contacts on the top surface, so collector current must travel sideways through the thin epi-layer — which would give a large series resistance were it not for the buried layer. That single constraint is the reason step 3 exists at all.
Hence, the correct sequence is 3, 4, 2, 1.
Match the following :
| List - I | List - II |
| (a) Lift - off | (i) Fick's Equation |
| (b) Dry Etching | (ii) PMMA (Poly Methyl Methacrylate) |
| (c) Lithography | (iii) Bombardment of Plasma |
| (d) Diffusion | (iv) Structures of Target Material on the Surface of Substrate |
Codes :
Match the following :
| List - I | List - II |
| (a) Lift OFF | (i) Etching |
| (b) Rant's Rule | (ii) Crystal Growtd |
| (c) Hydrofluoric acid | (iii) Packaging |
| (d) Float zone | (iv) Metallisation |
Codes :
What is the name of adhesion promoter used in case of positive photo resist ?
Read the following passage and answer the questions that follow :
Diffusion of impurity atoms in silicon is important in silicon integrated circuit processing. The idea of using diffusion techniques to alter the type of conductivity in silicon or germanium was disclosed in a patent by Pfann. Since then various ways of introducing dopants into silicon by diffusion have been studied with the goal of controlling dopant distribution, total dopant concentration, its uniformity reproducibility, and of processing a large number of device wafers in a batch to reduce the manufacturing cost. The diffusion is used to form bases, emitters and resistors in bipolar devices technology, to form source and drain regions and to dope polysilicon in MOS device technology. Dopant atoms that span a wide range of concentrations can be introduced into silicon in many ways.
When silicon dioxide of thickness d is grown, the Silicon consumed is :
Match List - I with List - II.
| List - I | List - II |
| (A) Annealing | (I) Isolation |
| (B) Sealing | (II) Doping |
| (C) Ion implantation | (III) Packing density |
| (D) Oxidation | (IV) Crystal restoration |
Choose the correct answer from the options given below :
Arrange the following in ascending order based on their diffusivity :
(A) Boron
(B) Arsenic
(C) Antimony
(D) Phosphorus
Choose the most appropriate answer from the options given below :
A thin layer of dopant is deposited onto silicon surface with a fixed total amount of dopants QT per unit area. If D is the diffusivity of dopants, then the surface concentration is :
The idea of using diffusion techniques was disclosed in patent by Pfann in the year :
Fick's second law of diffusion in one dimensional form can be expressed as :
A. For impurity diffusion in semiconductor, concentration gradient is the only essential requirement.
B. Annealing is a mandatory step after ion-implantation.
C. Wet etching is normally anisotropic
D. High temperature is required for the growth of $SiO_2$ because oxidation reaction takes place at high temperature
E. Bird's beak formation is a characteristic of LOCOS isolation
Choose the correct answer from the options given below:
| LIST-I | LIST-II |
| A. Shallow trench isolation (STI) | I. Low static power dissipation |
| B. Junction isolation | II. High static power dissipation |
| C. CMOS technology | III. High component density |
| D. Bipolar IC technology | IV. Low component density |
Given below are two statements: one is labelled as Assertion A and the other is labelled as Reason R
Assertion A: Impurity diffusion in semiconductor essentially needs very high temperature.
Reason R: Diffusivity of impurity atoms is negligibly small at room temperature.
In the light of the above statements, choose the most appropriate answer from the options given below
Match the following :
| List - I | List - II |
| (a) Lift - off | (i) Fick's Equation |
| (b) Dry Etching | (ii) PMMA (Poly Methyl Methacrylate) |
| (c) Lithography | (iii) Bombardment of Plasma |
| (d) Diffusion | (iv) Structures of Target Material on the Surface of Substrate |
Codes :