A. For impurity diffusion in semiconductor, concentration gradient is the only essential requirement. B. Annealing is a mandatory step after ion-implantation. C. Wet etching is normally anisotropic D. High temperature is required for the growth of $SiO_2$ because oxidation reaction takes place at high temperature E. Bird's beak formation is a characteristic of LOCOS isolation Choose the correct answer from the options given below:
Evaluating each statement regarding semiconductor processing:
Statements B and E are correct. This corresponds to Option 3.
Arrange the given process steps in sequence for self-aligned gate formation.
A. Thermal oxidation to grow gate oxide.
B. Polysilicon deposition
C. Photolithography using gate mask
D. Etching of polysilicon and oxide
E. Source/drain diffusion
Choose the correct answer from the options given below:
| LIST-I | LIST-II |
| A. Shallow trench isolation (STI) | I. Low static power dissipation |
| B. Junction isolation | II. High static power dissipation |
| C. CMOS technology | III. High component density |
| D. Bipolar IC technology | IV. Low component density |
Given below are two statements: one is labelled as Assertion A and the other is labelled as Reason R
Assertion A: Impurity diffusion in semiconductor essentially needs very high temperature.
Reason R: Diffusivity of impurity atoms is negligibly small at room temperature.
In the light of the above statements, choose the most appropriate answer from the options given below
When silicon dioxide of thickness d is grown, the Silicon consumed is :