The evaporation rate from a clean surface is related to the equilibrium vapour pressure Pe of the evaporating species of molecular weight M by an expression :
\(R=4.43\times10^{-4}\left(\dfrac{M}{T}\right)^{1/2}P_{e}\)
This is the Langmuir-Knudsen relation, and the square root is its signature — option 3:
\(R=4.43\times10^{-4}\left(\dfrac{M}{T}\right)^{1/2}P_{e}\)
Where the square root comes from. The rate at which molecules leave a surface is the rate at which they would strike it from a gas at the equilibrium pressure — the flux given by kinetic theory:
\(\Phi=\dfrac{P_{e}}{\sqrt{2\pi mkT}}\)
The \(\sqrt{mT}\) in the denominator arises because the mean molecular speed varies as \(\sqrt{T/m}\). Converting number flux to mass flux multiplies by the molecular mass, and one power of \(\sqrt{m}\) survives in the numerator — giving the \(\left(M/T\right)^{1/2}\) that identifies the correct option.
| Option | Fault |
|---|---|
| 1 | M/T to the first power — no square root |
| 2 | Right form, wrong constant |
| 3 | ✓ |
| 4 | Both the power and the constant wrong |
Reading the physics out of the formula. Two dependences matter, and they pull in opposite directions.
The dominant term is \(P_{e}\), and it is exponential in temperature through the Clausius-Clapeyron relation, \(P_{e}\propto e^{-\Delta H/RT}\). Raising the source temperature therefore increases the rate enormously — which is how deposition rate is actually controlled.
The explicit \(1/\sqrt{T}\) works the other way but is a very weak dependence, entirely swamped by the exponential. Its presence reflects that hotter molecules, though more numerous in the vapour, are also individually lighter in their contribution per unit pressure.
The heavier the species, the slower it evaporates at a given vapour pressure, since a large M means slow molecules — the \(\sqrt{M}\) in the numerator being a mass-flux effect rather than a count.
Why the relation matters in fabrication. Vacuum evaporation deposits metal films for contacts and interconnect, and the relation gives the deposition rate from the source temperature. It also explains why a high vacuum is essential: the mean free path must exceed the source-to-substrate distance, or the vapour scatters on residual gas and arrives non-uniformly, which is why evaporation is done below \(10^{-5}\) torr.
Hence, the correct expression is option 3.
Czochralski system of crystal growth is a
The thermal oxidation of silicon single crystal producer stacking faults lying on the plane.
The desired properties of metallization for integrated circuits are
A. low resistivity.
B. low conductivity.
C. easy to etch for pattern generation.
D. tough to etch for pattern generation.
E. no contamination with device or wafers.
Choose the correct answer from the options given below :
The major processing steps of BJT IC fabrication in VLSI technology are
A. Oxidation
B. Diffusion
C. Crystal growth
D. Photolithography
E. Epitaxial layer formation
Choose the correct ascending order from the options given below :
MEMS devices are within the size range of
Given below are two statements :
Statement I : Concentration of acceptor atoms in the region between isolation islands in a monolythic integrated circuit will be much higher then in a p-type substrate.
Statement II : The higher density is provided to prevent the depletion region of the reverse biased isolation to substrate junction from extending into the p+ type material.
In the light of the above statements, choose the most appropriate answer from the options given below :
Arrange the following fabrication steps in order needed to fabricate the IC :
(a) Oxidation (b) Etching (c) Metallization (d) Epitaxial growth
Codes :
Assertion (A) : In a bipolar IC fabrication, the diode isolation is used to isolate one device from the other.
Reason (R) : P+n diode used as isolation diode in IC fabrication.
Select your answer using the codes given below.
Assertion (A) : The value of thin film resistor can be changed even after fabrication.
Reason (R) : This is done by means of trimming.
Select your answer using the codes given below.
Assertion (A) : The epitaxial layer growth possesses the same crystal structure to that of the substrate on which it is grown.
Reason (R) : It can only be of similar conductivity type but possesses different value of resistivity to that of the substrate.
Select your answer using the codes given below.
What is the process of designing more than 100 gates on a single chip?
As per the standards set by the Department of Telecom, Government of India, for all the new designs of mobile handsets, the permissible Specific Absorption Rate (SAR) limit is _______ averaged over 1 gram of human tissue with effect from 1st September 2012.
In a silicon oxidation model, \(\rm \frac{B}{A}\) is the linear rate constant and τ accounts for the shift in the time coordinate to account for the presence of the initial oxide layer, then the linear law is represented as:
Which of the following are the major steps which are taken to troubleshoot a microcomputer system? Assume all ICs are in the socket.
A. Identify the symptoms and make a careful visual and tactical inspection.
B. Check the power supply.
C. Switch OFF and ON the system.
D. Check the control signals such as
\(\rm \overline{RD}, \overline{WR}\) , ALE, RDY and RESET
Choose the correct answer from the options given below:
The desired property of gate and interconnection metallization is