Czochralski system of crystal growth is a
Liquid-solid mono-component growth system
What the Czochralski (CZ) process is. It is the standard industrial method for growing the large single-crystal silicon ingots from which wafers are sliced. Electronic-grade polysilicon is melted in a fused-silica crucible at about 1420 °C; a small, precisely oriented seed crystal is dipped into the melt and then slowly pulled upward while both seed and crucible rotate. Atoms from the melt attach themselves to the seed and solidify with the same crystal orientation, so a large cylindrical single crystal (boule) grows continuously from the liquid.
Classifying it — the two things the option asks about.
Phase transition: the material starts as a molten liquid and ends as a solid crystal, so this is a liquid-to-solid (melt-growth) system. It is not solid-solid, which would describe processes such as solid-phase recrystallisation or strain-anneal grain growth, where no melt is involved.
Number of components: the melt and the crystal are the same single material — silicon. Nothing else is required to form the crystal (the dopant added to the melt is present in parts-per-million and does not constitute a second component of the growth system). It is therefore a mono-component system. A bi-component system is one where the growing solid is formed from two distinct constituents, as in compound-semiconductor growth (e.g. Ga and As for GaAs) or in solution/vapour growth where the crystal is deposited from a carrier or solvent.
Related methods worth knowing. Float-zone (FZ) growth is also liquid–solid and mono-component but uses no crucible, so it yields lower oxygen contamination and higher purity; Bridgman–Stockbarger is another melt (liquid–solid) technique; epitaxy from a gas source is a vapour–solid process.
Hence, the Czochralski method is a liquid–solid, mono-component growth system.
The thermal oxidation of silicon single crystal producer stacking faults lying on the plane.
The desired properties of metallization for integrated circuits are
A. low resistivity.
B. low conductivity.
C. easy to etch for pattern generation.
D. tough to etch for pattern generation.
E. no contamination with device or wafers.
Choose the correct answer from the options given below :
The major processing steps of BJT IC fabrication in VLSI technology are
A. Oxidation
B. Diffusion
C. Crystal growth
D. Photolithography
E. Epitaxial layer formation
Choose the correct ascending order from the options given below :
MEMS devices are within the size range of
Given below are two statements :
Statement I : Concentration of acceptor atoms in the region between isolation islands in a monolythic integrated circuit will be much higher then in a p-type substrate.
Statement II : The higher density is provided to prevent the depletion region of the reverse biased isolation to substrate junction from extending into the p+ type material.
In the light of the above statements, choose the most appropriate answer from the options given below :
Arrange the following fabrication steps in order needed to fabricate the IC :
(a) Oxidation (b) Etching (c) Metallization (d) Epitaxial growth
Codes :
Assertion (A) : In a bipolar IC fabrication, the diode isolation is used to isolate one device from the other.
Reason (R) : P+n diode used as isolation diode in IC fabrication.
Select your answer using the codes given below.
Assertion (A) : The value of thin film resistor can be changed even after fabrication.
Reason (R) : This is done by means of trimming.
Select your answer using the codes given below.
Assertion (A) : The epitaxial layer growth possesses the same crystal structure to that of the substrate on which it is grown.
Reason (R) : It can only be of similar conductivity type but possesses different value of resistivity to that of the substrate.
Select your answer using the codes given below.
In an npn diffused junction transistor, the p-type base region is formed on the n-type collector region through the process of :
What is the process of designing more than 100 gates on a single chip?
As per the standards set by the Department of Telecom, Government of India, for all the new designs of mobile handsets, the permissible Specific Absorption Rate (SAR) limit is _______ averaged over 1 gram of human tissue with effect from 1st September 2012.
In a silicon oxidation model, \(\rm \frac{B}{A}\) is the linear rate constant and τ accounts for the shift in the time coordinate to account for the presence of the initial oxide layer, then the linear law is represented as:
Which of the following are the major steps which are taken to troubleshoot a microcomputer system? Assume all ICs are in the socket.
A. Identify the symptoms and make a careful visual and tactical inspection.
B. Check the power supply.
C. Switch OFF and ON the system.
D. Check the control signals such as
\(\rm \overline{RD}, \overline{WR}\) , ALE, RDY and RESET
Choose the correct answer from the options given below:
The desired property of gate and interconnection metallization is