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Question

In X-ray Diffractometers, line intensities depend on _____ and kind of atomic reflection centres in each set of plates.

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MH SET 2025 Paper 2 Hindi Question Paper (15-Jun-2025)
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Number

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In X-ray diffractometry the intensity of a Bragg reflection from a set of lattice planes \((hkl)\) is governed by the structure factor \(F_{hkl}=\sum_j f_j\,e^{2\pi i(hx_j+ky_j+lz_j)}\), in which the sum runs over every atomic reflection centre in the unit cell. The measured line intensity is proportional to \(|F_{hkl}|^2\), multiplied by geometry, polarisation and multiplicity factors.

The magnitude of this sum depends on two things: the kind of atom at each site (through the atomic scattering factor \(f_j\), which grows with atomic number), and the number of such reflecting atomic centres contributing coherently in each set of planes. That is why crystals with many, heavy scattering centres in a plane produce very intense lines while planes with few or light atoms show weak lines.

Position determines the angular location of a peak (through Bragg’s law), not its intensity; line length and interline spacing are not the primary intensity controls.

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