The problem asks for the angle of incidence ($\theta_i$) at which total reflection occurs when a TEM wave moves from a dielectric medium 1 ($\epsilon_{r1} = 2$) to a dielectric medium 2 ($\epsilon_{r2} = 1$) at an oblique angle.
For non-magnetic dielectric materials ($\mu_r = 1$), the refractive index ($n$) is related to the relative permittivity ($\epsilon_r$) by the formula:
$n = \sqrt{\mu_r \epsilon_r} = \sqrt{\epsilon_r}$
Calculate the refractive indices for both media:
Total internal reflection occurs when the wave travels from a medium with a higher refractive index to one with a lower refractive index ($n_1 > n_2$), and the angle of incidence exceeds the critical angle ($\theta_c$). In this case, $n_1 = \sqrt{2}$ and $n_2 = 1$, so $n_1 > n_2$, and total reflection is possible.
The critical angle $\theta_c$ is found using the relationship derived from Snell's Law, where the angle of refraction is $90^\circ$:
$\sin(\theta_c) = \frac{n_2}{n_1}$
Substitute the calculated refractive indices:
$\sin(\theta_c) = \frac{1}{\sqrt{2}}$
To find the angle $\theta_c$, we take the arcsine:
$\theta_c = \arcsin\left(\frac{1}{\sqrt{2}}\right)$
This value corresponds to:
$\theta_c = 45^\circ$
Therefore, the angle of incidence for total reflection is $45^\circ$. This matches Option C.
For the series diode configuration of the given figure, determine $V_D$ and $I_D$.
For the given emitter-bias network, determine the values of $I_C$ and $V_{CE}$. Assume $\beta = 100$.