Arrange the following materials in ascending order based on their mobility of electrons at 300 K : (a) Germanium (b) Silicon (c) Gallium Arsenide (d) Gallium Nitride Codes :
(d) (b) (a) (c)
To arrange the given materials—Germanium, Silicon, Gallium Arsenide, and Gallium Nitride—in ascending order based on their electron mobility at 300 K, we need to understand that electron mobility is a critical property which indicates how quickly an electron can move through a semiconductor material when subjected to an electric field.
Electron mobility is influenced by the material's crystalline structure, atomic bonding, and purity. Typically, compound semiconductors like Gallium Arsenide have higher electron mobility compared to elemental semiconductors like Silicon and Germanium.
Based on these observations, we can list the materials in increasing order of their electron mobility as follows:
Thus, the correct option that arranges these materials in ascending order of their electron mobility is: (d) (b) (a) (c)
Atomic numbers for the following semiconducting and doping materials like Ga, In, As, Sb are respectively :
A. 33
B. 49
C. 31
D. 51
Choose the correct answer from the options given below :
Energy bands of a material is decided by :
(a) The atomic number
(b) Relative spacing of atoms in the solids
(c) Melting point of the material
(d) Hardness of the material
Which of the following is correct ?
Arrange the following materials with respect to their relative dielectric constants in descending orders :
(A) Ge
(B) C
(C) CdS
(D) TiO2
Choose the most appropriate answer from the options given below :
The most common kind of area defect found in silicon is the ________ and it always occur along ________ plane.
| LIST-I | LIST-II |
| A. BJT | I. Five layers and four junction device |
| B. MOSFET | II. Power switching device with fast acting features and high power capability with voltage control features |
| C. IGBT | III. Voltage controlled device |
| D. DIAC | IV. Current controlled device |
The common drain circuit has a FET with $Y_{fs}$=3000 µS, $R_{gs}$=100 MΩ and $r_d$=50 KΩ. Determine the device input impedance. 