Explore Exams
Test Series
Live Tests
Prev. Papers
Quizzes
Live Quizzes
Current Affairs
News
Prepp+
GamesLogin / Register
All Exams Test series for 1 year @ ₹349 only

UGC NET 2023 Electronic Science Question Paper (13-Dec-2023) (Shift 1); Download PDF

UGC NET 2023 Electronic Science Question Paper (13-Dec-2023) (Shift 1) represents the latest National Testing Agency standards, integrating core and advanced electronics into a single comprehensive test. This session features modern topics like 5G communication, advanced CMOS technology, and digital signal processing as tested in the 2023 cycle.

Free
UGC NET 2023 Electronic Science Question Paper (13-Dec-2023) (Shift 1)
120 Minutes
100 Questions
200 Marks
English
Showing 1 - 5 of 100 questions
Page 1 of 20

Q1.

The most common kind of area defect found in silicon is the ________ and it always occur along ________ plane.

Q2.

An important figure of merit for microwave application of Schottky diode is forward bias cut off frequency fco and is given by :

Q3.

In MOSFET, the carrier velocity between constant mobility regime and the saturation velocity can be described as :

Q4.

In a MOS structure the φm is the work function of metal and φs is the work function of semiconductor then the flat band voltage is :

Q5.

When exposed to light, the positive resists in developer solution responds by becoming :

⋯
Page 1 of 20
Jump to:
Need Expert Advice?
Test Series
UGC NET img
Teaching
UGC NET (Paper 1) 2026 Mock Test Series
476 Tests 1 Tests Free
4.3(72)
English
View Test Series