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Question

Consider the following statements regarding MOSFETS :

1. For the values of $V_{GS}$ less than the threshold level, the drain current of an enhancement-type MOSFET is 0 mA.

2. For the levels of $V_{GS} \le V_T$, the drain current is related to the applied gate-to-source voltage by the non-linear relationship

$I_D = k(V_{GS} - V_T)^2$

3. The $k$ term is a constant that is a function of the construction of the device. The value of $k$ can be determined from the equation

 $k = \frac{I_{D(on)}}{(V_{GS(on)} - V_T)^2}$

 where $I_{D(on)}$ and $V_{GS(on)}$ are the values for each at a particular point on the characteristics of the device.

Which of the above statements are correct?

The correct answer is
1 and 3 only

Analyzing MOSFET Statements

We need to evaluate the correctness of the three statements regarding enhancement-type MOSFETs.

Statement 1 Analysis: Threshold Voltage and Drain Current

An enhancement-type MOSFET requires the gate-to-source voltage ($V_{GS}$) to exceed the threshold voltage ($V_T$) to form a conductive channel between the drain and source. Therefore, for $V_{GS} < V_T$, the MOSFET is in the cutoff region, and the drain current ($I_D$) is effectively zero.

Conclusion: Statement 1 is correct.

Statement 2 Analysis: Drain Current Equation

The equation $I_D = k(V_{GS} - V_T)^2$ describes the drain current ($I_D$) in the **saturation region** of an enhancement-type MOSFET, which occurs when $V_{GS} > V_T$ and $V_{DS} \ge V_{GS} - V_T$. This equation is non-linear. However, the statement incorrectly applies this relationship for $V_{GS} \le V_T$. As established in Statement 1, for $V_{GS} \le V_T$, $I_D = 0$ mA.

Conclusion: Statement 2 is incorrect.

Statement 3 Analysis: The 'k' Parameter

The constant '$k$' (often expressed as $K_n = \mu_n C_{ox} \frac{W}{2L}$) is indeed dependent on the physical construction of the MOSFET, including material properties (like carrier mobility $\mu_n$), oxide capacitance ($C_{ox}$), and the device dimensions (width $W$ and length $L$). The formula provided, $k = \frac{I_{D(on)}}{(V_{GS(on)} - V_T)^2}$, is a valid way to calculate '$k$' using a specific known operating point ($I_{D(on)}$ at $V_{GS(on)}$) in the saturation region, assuming $V_{GS(on)} > V_T$.

Conclusion: Statement 3 is correct.

Final Conclusion

Based on the analysis, statements 1 and 3 are correct, while statement 2 is incorrect. Therefore, the correct option includes statements 1 and 3 only.

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Important Questions from MOSFET

  1. Which industry does aluminium smelting belong to?

  2. Given, Vgs is the gate-source voltage, Vds is the drain source voltage, and Vth is the threshold voltage of an enhancement type NMOS transistor, the conditions for transistor to be biased in saturation are

  3. A switched mode power supply operating at 20 kHz to 100 kHz range uses as the main switching element is __________.

  4. Which semiconductor power device out of the following, is not a current triggering device?

  5. A CMOS amplifier when compared to an N–channel MOSFET, has the advantage of

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