In a p-n Junction with no externally app voltage, the drift and diffusion components of the hole and electron currents:
In a semiconductor p-n junction, when there is no external voltage applied, the junction is said to be in a state of thermal equilibrium. In this equilibrium condition, there is a fundamental balance between two opposing types of charge carrier movements: diffusion and drift.
Diffusion current occurs due to the concentration gradient of charge carriers. In a p-n junction:
This movement constitutes the diffusion current, for both holes and electrons, flowing across the junction.
As diffusion occurs, a depletion region (or space-charge region) forms at the junction. Within this depletion region, an electric field is established, directed from the n-side to the p-side. This electric field causes drift current:
This movement of minority carriers due to the electric field is the drift current.
When the p-n junction is in equilibrium (i.e., no external voltage is applied), the net current flowing across the junction is zero. This happens because the diffusion current and the drift current for each type of carrier exactly balance each other out.
Consider the individual carrier currents:
Since both the net hole current and the net electron current are zero separately, the total current across the junction is also zero:
\[I_{\text{total}} = I_p + I_n = 0 + 0 = 0\]Therefore, in a p-n junction with no externally applied voltage, the drift and diffusion components of the hole and electron currents sum to zero, ensuring no net flow of charge and maintaining thermal equilibrium.
In a semiconductor diode, the cut-in voltage is the voltage:
The leakage current in a pn junction is of the order of:
Diode junction breakdowns above 5 V are caused by:
The width of the depletion layer in a P-N junction diode
ln a p-n junction diode the forward current