An n-type GaAs Gunn diode has the following parameters drift velocity (Vd) = $10^7$ cm/s, Doping concentration = $2 \times 10^{14}$ cm$^{-3}$, and electric field = 3200 V/cm. Choose the correct option:
A. Current density = 320 A/cm²
B. Electron mobility = 3100 cm²/v-s
C. Current density = 120 A/cm²
D. Electron mobility = 1450 cm²/v-s
E. Electron mobility = 1500 cm²/v-s
Choose the correct answer from the options given below:
This solution details the calculation of essential parameters for an n-type GaAs Gunn diode. We will determine the current density and electron mobility using the provided drift velocity, doping concentration, and electric field values.
The current density ($J$) represents the flow of electrical current per unit cross-sectional area. For a semiconductor like the GaAs Gunn diode, assuming uniform doping, it is calculated using the formula:
$J = n \cdot q \cdot V_d$
Where:
Plugging the given values into the current density formula:
$J = (2 \times 10^{14} \text{ cm}^{-3}) \times (1.602 \times 10^{-19} \text{ C}) \times (10^7 \text{ cm/s})$
First, multiply the numerical values:
$2 \times 1.602 = 3.204$
Next, combine the powers of 10:
$10^{14} \times 10^{-19} \times 10^7 = 10^{(14 - 19 + 7)} = 10^2$
Combine these parts to find the current density:
$J = 3.204 \times 10^2 \text{ A/cm}^2$
$J \approx 320 \text{ A/cm}^2$
This calculated value closely matches the statement in Option A.
Electron mobility ($\mu_e$) quantifies how efficiently electrons move within the semiconductor material when subjected to an electric field. The relationship is defined as:
$V_d = \mu_e \cdot E$
To find the electron mobility, we rearrange the formula:
$\mu_e = \frac{V_d}{E}$
Substitute the known values into the mobility formula:
$\mu_e = \frac{10^7 \text{ cm/s}}{3200 \text{ V/cm}}$
Perform the division:
$\mu_e = \frac{10,000,000}{3200} \text{ cm}^2/\text{V} \cdot \text{s}$
$\mu_e = \frac{100000}{32} \text{ cm}^2/\text{V} \cdot \text{s}$
$\mu_e = 3125 \text{ cm}^2/\text{V} \cdot \text{s}$
This calculated electron mobility is approximately 3125 cm²/V·s. This value is very close to the value stated in Option B (3100 cm²/v-s), suggesting it is a correct approximation.
Our calculations confirm the following:
Therefore, statements A and B are accurate based on the provided parameters and standard semiconductor physics principles.
In a pure silicon, what is the time for an electron to drift $1\mu m$ in an electric field of 100 V/cm?
Assume electron mobility of $1350 \text{ cm}^2/V-s$
A. An impurity scattering cause decrease in mobility with decrease in temperature.
B. A slow moving carrier is likely to scatter more strongly than carrier with great momentum
C. Drift velocity of an electron increases with decrease in mobility
D. Drift velocity of an electron decrease with decrease in mobility
E. At critical electric field ($=10^5V/cm$) drift velocity tends to saturate.
Choose the correct answer from the options given below:
Consider the following statements :
If an electric field is applied to an n-type semiconductor bar, the electrons and holes move in opposite directions due to their opposite charges. The net current is
1. due to both electrons and holes with electrons as majority carriers.
2. the sum of electron and hole currents.
3. the difference between electron and hole current.
Which of these statements is/are correct ?
Consider the following :
1. In semiconductors, the mobility of electrons is more than that of holes.
2. In semiconductors, the resistivity increases with the increase in temperature.
3. Metal has positive TCR.
4. In metals, thermal conductivity is inversely proportional to electronic conductivity at a particular temperature.
Which of the following statements are correct ?
The Debye length is a characteristic length for semiconductor. Arrange the doping density given below in such a way that Debye length changes from maximum to minimum.
(A) N = 1015 cm–3
(B) N = 1017 cm–3
(C) N = 3 × 1015 cm–3
(D) N = 1016 cm–3
(E) N = 5 × 1016 cm–3
Choose the most appropriate answer from the options given below :